The 2024 IEEE International Conference on Metrology for Archaeology and Cultural Heritage, METRO ARCHAEO, will be held from October 7 to 9 in Valletta, Malta. The conference, organized by the Institute of Electrical and Electronics Engineers (IEEE), focuses on the application of metrology, the science of measurement, in the context of archaeology and cultural heritage, bringing together experts and researchers from various disciplines to discuss and share methodologies, technologies, and innovative tools used for the measurement, analysis, conservation, and enhancement of archaeological and cultural heritage assets.
Melania Paturzo, Vito Pagliarulo, and Massimo Rippa, along with their colleague Claudia Daffara, will organize Special Session #5, Non-destructive imaging and interferometric techniques for cultural heritage diagnostics and metrology.
https://www.metroarcheo.com/special-session-5
A crucial point in cultural heritage is an in-depth knowledge of the artwork’s structural and material characteristics to identify the actual conservation state and to prevent risk and decay factors. The use of optical techniques, based on imaging and interferometric methods, also in integrated protocols, currently represents the good practice for performing non-destructive diagnostics on different types of artworks in full-field and at different scales. Researchers of the heritage science community are being called to develop and optimize novel techniques, portable instrumentation, and measurement protocols for artwork metrology and efficient diagnostics.
The scope of this special session is to collect contributions on the latest experimental results concerning the development and application of optical imaging and interferometric techniques in cultural heritage diagnostics, including, but not limited to, the following list of topics: interferometric techniques, laser speckle metrology, infrared and thermal imaging, Thz techniques, DSPI, shearography, thermography, 3D scanning and photogrammetry, multimodal and multispectral imaging.
PAPER / ABSTRACT SUBMISSION DEADLINE
June 15, 2024
PAPER / ABSTRACT ACCEPTANCE NOTIFICATION
July 15, 2024
FINAL PAPER SUBMISSION DEADLINE
September 1, 2024